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Rising Test Cost
Growing ATPG vector volume, scan infrastructure, ATE time, and package/GPIO pressure increase the cost of manufacturing validation.
VEGATEST™
Runtime Structural Diagnostics for Advanced SoCs
Execution-coupled structural diagnostics that connect manufacturing test, system-level test, in-field validation, reliability, RAS, and silicon lifecycle management through one runtime-aware diagnostic foundation.
The Challenge
Semiconductor Test Is Becoming Fragmented Across the Lifecycle
Advanced SoCs are validated across factory test, system-level test, in-field diagnostics, telemetry, reliability monitoring, RAS, and silicon lifecycle management. These phases are often treated as separate flows, even though modern failure mechanisms increasingly depend on real workload, voltage, thermal, aging, and operating conditions.
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SLT Ambiguity
System-level test exposes realistic behavior, but often lacks explicit fault models, structural observability, and quantifiable diagnostic coverage.
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In-Field Gaps
Runtime diagnostics, LBIST, MBIST, telemetry, and RAS flows can remain disconnected from manufacturing-grade structural intent.
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Lifecycle Fragmentation
Manufacturing, deployment, reliability, field returns, and SLM data are often not aligned under one continuous diagnostic framework.
Our Solution
Execution-Aware Structural Diagnostics
VegaTest™ introduces a unified runtime-aware structural diagnostic framework that extends manufacturing-grade diagnostic intent into system-level and deployed operation.
Rather than treating production test, SLT, in-field diagnostics, reliability monitoring, and SLM as disconnected stages, VegaTest coordinates structural rigor, runtime orchestration, diagnostic visibility, and lifecycle telemetry across the SoC lifetime.
VegaTest turns test from a factory-only event into a continuous silicon intelligence framework.
Architecture Overview
Unified Runtime Test Architecture
VegaTest combines structural diagnostic intent, runtime-aware orchestration, execution-coupled observability, and lifecycle telemetry into a coordinated diagnostic architecture for advanced SoCs.
The framework is designed to align factory test, system-level test, in-field validation, RAS, reliability monitoring, and SLM without relying exclusively on scan-heavy infrastructures or isolated post-silicon flows.
- Runtime-aware structural diagnostic orchestration
- Manufacturing-to-field diagnostic continuity
- Support for at-speed timing, voltage, and marginality screening
- Improved SLT observability through structural diagnostic intent
- Lifecycle telemetry for reliability, degradation, and field insight
- Integration with DFT, PMU, firmware, RAS, and SLM infrastructure
Lifecycle Coverage
One Diagnostic Foundation Across Factory, System, and Field
VegaTest aligns diagnostic objectives across multiple phases of the silicon lifecycle, helping SoC teams reduce discontinuity between what is tested in manufacturing and what is observed during deployment.
Phase 01
Manufacturing Test
Supports high-confidence at-speed validation while reducing reliance on long ATE execution, excessive vector volume, and scan-heavy dependency for timing-sensitive screening.
- TDF/PDF and timing-sensitive screening
- Vmin / Fmax characterization support
- Manufacturing throughput improvement
Phase 02
System-Level Test
Brings stronger diagnostic meaning into SLT by combining realistic operating environments with structural diagnostic visibility and runtime-aware orchestration.
- More meaningful fault observability
- Better factory-to-SLT correlation
- Reduced ambiguity in realistic workloads
Phase 03
In-Field Diagnostics
Extends structural assurance into deployed systems without depending only on disruptive offline test, scan access, or disconnected periodic diagnostics.
- Runtime diagnostic visibility
- Field health monitoring
- Reduced silent data corruption risk
Phase 04
SLM / Reliability
Connects diagnostic behavior, degradation trends, aging awareness, and field telemetry into a stronger lifecycle intelligence foundation.
- Aging and degradation tracking
- Fleet-level silicon health visibility
- Predictive maintenance support
System-Level Impact
Beyond Test Cost: Lifecycle Silicon Assurance
VegaTest is designed to improve semiconductor economics and diagnostic quality while enabling a more continuous view of silicon integrity from manufacturing through deployed operation.
Lower Manufacturing Test Cost
Reduces dependence on long at-speed ATE execution and excessive structural pattern volume.
Improved Yield & Binning Insight
Supports more representative screening of marginal silicon under timing- and voltage-sensitive behavior.
Stronger SLT Value
Adds clearer diagnostic meaning to system-level test where conventional SLT can be difficult to quantify.
Reduced Escape Risk
Improves continuity between production screening, system validation, runtime diagnostics, and field monitoring.
RAS & Reliability Intelligence
Provides diagnostic telemetry for degradation tracking, fleet health monitoring, and predictive maintenance.
Unified Lifecycle Framework
Connects DFT, SLT, in-field diagnostics, reliability, RAS, and SLM in a coordinated architecture.
Ecosystem Fit
Built for Modern Test, Reliability, and SLM Flows
VegaTest is designed to complement advanced-node SoC test, DFT, system-level validation, reliability monitoring, in-field diagnostics, RAS, and silicon lifecycle management flows.
DFT / ATPG
At-Speed Test
TDF / PDF
Vmin / Fmax
System-Level Test
In-Field Diagnostics
RAS
SLM Telemetry
Reliability / Aging
Fleet Health Monitoring
Automotive / AI / Cloud / Edge
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Ready to Rethink Runtime Structural Diagnostics?
Explore how VegaTest™ enables execution-coupled diagnostics across manufacturing, system-level test, in-field validation, reliability, RAS, and silicon lifecycle management.